000 01166cam a2200289 i 4500
999 _c326
_d326
001 406460
003 Biblioteca de INTEMIN
005 20180419201718.0
008 800122s1980 dcua b f000 0 eng
010 _a 79607938
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTN23
_b.U43 no. 8455
_aQC176.84.R3
082 0 0 _a622 s
_a530.4/1
086 0 _aI 28.23:(no.)
100 1 _aSartwell, Bruce D.
_91001
245 1 0 _aCharacterization of thin films and solid surfaces using proton-induced X-ray emission /
_cby Bruce D. Sartwell and Arthur B. Campbell, III.
260 _a[Washington] :
_bU.S. Dept. of the Interior, Bureau of Mines,
_c1980.
300 _a22 p. :
_bill. ;
_c27 cm.
490 1 _aReport of investigations - Bureau of Mines ;
_v8455
504 _aBibliography: p. 21-22.
650 0 _aThin films
_xEffect of radiation on.
_91126
650 0 _aSolids
_xSurfaces.
_91127
650 0 _aProton-induced X-ray emission.
_91128
700 1 _aCampbell, Arthur Byron,
_d1924-
_ejoint author.
_91129
830 0 _aReport of investigations (United States. Bureau of Mines) ;
_v8455.
_9793
906 _a7
_bcbc
_corignew
_d1
_encip
_f19
_gy-gencatlg
942 _2udc
_cBK