Sartwell, Bruce D. <br/><br/>
Characterization of thin films and solid surfaces using proton-induced X-ray emission / 
by Bruce D. Sartwell and Arthur B. Campbell, III. 
 - [Washington] :  U.S. Dept. of the Interior, Bureau of Mines,  1980. 
 - 22 p. :  ill. ;  27 cm. 
 - Report of investigations - Bureau of Mines ;  8455 .
 - Report of investigations (United States. Bureau of Mines) ;  8455. .
<br/><br/>Bibliography: p. 21-22. 
<br/><br/><label>LCCN: </label>79607938  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films--Effect of radiation on.<br/>Solids--Surfaces.<br/>Proton-induced X-ray emission.
<br/><br/><label>LC Class. No.: </label>TN23  QC176.84.R3  / .U43 no. 8455 
<br/><br/><label>Dewey Class. No.: </label>622 s  530.4/1 
<br/><br/><label>Gov. Doc. Class. No.: </label>I 28.23:(no.)